Probabilistic Analysis of a Quantum-Dot Cellular Automata Multiplier Implemented in Different Technologies

Since nanoelectronic devices are likely to be defective and error-prone, developing an understanding of circuit reliabilities and critical components will be required. In this paper, probabilistic transfer matrices are used to compare the reliability of a small multiplier circuit when considering both magnetic and molecular QCA implementations. These implementations are considered since the circuit designs may differ depending on the implementation. The magnetic multiplier has a higher reliability, but it still requires component error rates of less than 10 to achieve a reliability of above 99%. Additionally, to increase the reliability of the multiplier, the components that should be made defect tolerant first are identified as the wire, majority gate, and fanout. The need to make these specific components, two of which are interconnect, defect tolerant is independent of the implementation technology.